National Instruments Testimonials

"The test-time reduction using this SMU-per-pin method is nothing short of spectacular, and wouldn’t be possible with large, traditional box SMUs. Our method eliminated switching and serialized-measurement time, reducing total test time to that of testing a single test point."

"Engineers have long considered it impossible to probe these microbumps because the arrays are too large (≥1,000) and the pitches too small (≤40 µm). We developed a solution: a fully automated system to characterize prototype probe cards for large-array, fine-pitch microbumps on advanced test wafers using the Semiconductor Test System (STS) from NI."